Tuesday, May 22, 2012

Scanning probe lithography: ultrasonic vibration assisted nanomachining with an AFM

February 22, 2012 by SiliconValleyNano.com · Leave a Comment 

Controlled ultrasonic tip-sample vibration increases patterning speed and allows tunable feature dimensions View full post on nanotechweb.org: lab talk

High-speed laser scanning forms periodic nano-trenches on silicon

Japanese researchers demonstrate high-throughput fabrication of nanostructures over a large area using dual laser set-up View full post on nanotechweb.org: lab talk

Force scanning: quick maps and measurements of living cells

April 5, 2011 by SiliconValleyNano.com · Leave a Comment 

Versatile AFM technique gives high-resolution, spatial modulus maps at micro- and nanoscales View full post on nanotechweb.org: lab talk

Biosystems – Investigated by Scanning Probe Microscopy

September 15, 2010 by SiliconValleyNano.com · Leave a Comment 

Product DescriptionEssentials from the series “Applied Scanning Probe Methods” are put together in the area of bio and biorelated systems. The contributions spread over all 13 volumes are now combined in this one volume. Thus, the reader will easily find a comprehensive overview of SPM applications for biosystems. For scientists and professionals in academic and [...]

Scanning Tunneling Microscopy and Its Application

September 14, 2010 by SiliconValleyNano.com · Leave a Comment 

Product DescriptionScanning Tunneling Microscopy and its Application touches on the principles of STM and other related techniques, and their practical applications. It presents detailed STM instrumentation and the applications in metal and semiconductor surfaces, surface adsorbates and nano-fabrication. This title is particularly of practical use to the readers, as such detailed information is not available [...]

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