Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Product DescriptionMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved [...]

Rough surfaces induce silicon nanowire growth

Silicon nanowires produced at low temperatures without the use of any growth-inducing metal nanoparticles View full post on nanotechweb.org: lab talk Share and Enjoy: