Magnetic Microscopy of Nanostructures
September 21, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionThis volume contains a comprehensive collection of overview articles on novel microscopy methods for imaging magnetic structures on the nanoscale. Written by leading scientists in the field, the book covers synchrotron based methods, spin-polarized electron methods, and scanning probe techniques. It constitutes a valuable source of reference for graduate students and newcomers to the [...]
Noncontact Atomic Force Microscopy
September 20, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionSince 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be [...]
Microscopy of Semiconducting Materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
September 16, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionThe fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focused upon the most recent advances in the study of the structural [...]
Near-Field Nano-Optics: From Basic Principles to Nano-Fabrication and Nano-Photonics
September 15, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionThe book describes recent progress of near-field optical science and technology. The title of the book implies capabilities of optical near-field not only for imaging/microscopy but also for fabrication/manipulation/processing in nanometric scale. The authors introduce the differences between near-field optics and far-field optics from both an experimental and theoretical perspective. The book touches on [...]
Biosystems – Investigated by Scanning Probe Microscopy
September 15, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionEssentials from the series “Applied Scanning Probe Methods” are put together in the area of bio and biorelated systems. The contributions spread over all 13 volumes are now combined in this one volume. Thus, the reader will easily find a comprehensive overview of SPM applications for biosystems. For scientists and professionals in academic and [...]