Noncontact Atomic Force Microscopy

Product DescriptionSince 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be [...]

Taking MRI to the nanoscale by force

Force detection techniques can improve MRI sensitivity, resulting in spatial resolutions better than 10 nm View full post on nanotechweb.org: lab talk

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces

Product DescriptionMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved [...]

Noncontact Atomic Force Microscopy: Volume 2

Product DescriptionSince the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and [...]

High-speed atomic force microscope achieves large scan sizes

Sample stage area of 6.5 mm × 6.5 mm allows convenient handling of larger specimens View full post on nanotechweb.org: lab talk

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