Atomic Charges, Bond Properties, and Molecular Energies
September 14, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionThe first book to cover conceptual quantum chemistry, Atomic Charges, Bond Properties, and Molecular Energies deftly explores chemical bonds, their intrinsic energies, and the corresponding dissociation energies, which are relevant in reactivity problems. This unique first-hand, self-contained presentation develops relatively uncomplicated but physically meaningful approaches to molecular properties by providing derivations of all the [...]
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
September 10, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionScanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare [...]
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
September 6, 2010 by SiliconValleyNano.com · 1 Comment
Product DescriptionMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved [...]
Noncontact Atomic Force Microscopy: Volume 2
August 25, 2010 by SiliconValleyNano.com · Leave a Comment
Product DescriptionSince the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and [...]
High-speed atomic force microscope achieves large scan sizes
July 20, 2010 by SiliconValleyNano.com · Leave a Comment
Sample stage area of 6.5 mm × 6.5 mm allows convenient handling of larger specimens View full post on nanotechweb.org: lab talk