Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
September 6, 2010 by SiliconValleyNano.com · 1 Comment
Product Description
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
BUY FROM AMAZON –> Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces
This book is not very rigorous. It does not cover the details on the techniques. Very few diagrams. A lot of data with little scaling, theoretical treatment or simple mathematics to describe results. What am I supposed to do?… Memorize the results for each experiment?… It is representative with the poor state of research science. Lots of money, lots of people spending it buying equipment, and everybody doing what everybody else is doing, except using a different material. Poor… poor… poor…
Rating: 2 / 5